This paper investigates, the effect of RF power on the structural, optical properties of ZnO thin films. It was prepared
by RF magnetic sputtering at 400
C on a glass substrate. And working pressure (5 £ 10¡2 Torr), and different energy
values (50, 70 W). The effect of different radiofrequency powers. X-ray diffraction (XRD) and (Uv-Vis) methods were
used to explore the structural and optical characteristics of thin films. The growth rate and much more increased when
the RF power was increased. The results on the crystal structure demonstrated that polycrystalline patterns are common
in nature for all produced ZnO thin films, the hexagonal phase as well as the (002) plane's favored direction. The grain
size of the films was determined between (14e20 nm), indicating that all of these films had a nanocrystalline structure.
Data on the optical properties of the produced films The ZnO film was ideal for solar cell applications because it had
excellent transmittance values in the visible region (95 %), The energy gap was within the range of (3.30e3.34 eV) for
pure zinc oxide films prepared with different values of power, and we note that there is a slight increase in the energy
gap when increasing the power. Gas sensors were tested at various mixing ratios (NO2 97 %, air 3 %) and operational
temperatures (25, 100, 200, and 300
C) and using a bias voltage (6V). A temperature of about 300
C was found to be the
ideal working temperature for the sample. Greatest sensitivity (88 %) with a quick response time (17 s) and the fastest
recoveries (63 s), which take place at a temperature of 300
C. The result we came to was that the impact of power on the
surface topography and Crystal structure induced the creation of large-surface-area nanocrystals, which is highly advantageous,
and raises the sensor's sensitivity.